DocumentCode :
3388317
Title :
Learning Graphical Models for Hypothesis Testing
Author :
Sanghavi, Sujay ; Tan, Vincent ; Willsky, Alan
Author_Institution :
LIDS, MIT. sanghavi@mit.edu
fYear :
2007
fDate :
26-29 Aug. 2007
Firstpage :
69
Lastpage :
73
Abstract :
We propose a novel procedure for learning tractable graphical models from data samples. The traditional approach is to learn models that are generically good approximations of the underlying distributions. In contrast, we are interested in learning models for a specific purpose: binary hypothesis testing. The distributions corresponding to the hypotheses are not available, instead we are given two labelled sets of training samples. Our procedure learns two models, one for each hypothesis, which are then used in a likelihood ratio test for classifying a new unlabelled sample. Each model is learnt from both sets of training samples. Numerical simulations show that our procedure has a lower probability of classification error, as compared to a procedure that learns each model using only its own training set. The gain is more significant when the problem size is larger and the number of training samples available is smaller.
Keywords :
Contracts; Graphical models; Numerical simulation; Particle measurements; Random variables; Reduced order systems; Scholarships; Standards development; Testing; Tree graphs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Statistical Signal Processing, 2007. SSP '07. IEEE/SP 14th Workshop on
Conference_Location :
Madison, WI, USA
Print_ISBN :
978-1-4244-1198-6
Electronic_ISBN :
978-1-4244-1198-6
Type :
conf
DOI :
10.1109/SSP.2007.4301220
Filename :
4301220
Link To Document :
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