• DocumentCode
    3388958
  • Title

    Three dimensional characterisation of electrical trees

  • Author

    Schurch, Roger ; Rowland, S. ; Bradley, Robert S. ; Withers, Philip J.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester, UK
  • fYear
    2013
  • fDate
    20-23 Oct. 2013
  • Firstpage
    494
  • Lastpage
    497
  • Abstract
    Most of the geometric analysis of the structure of electrical trees has been performed using a two-dimensional (2-D) approach. However, electrical trees grow three-dimensionally (3D). The authors have recently shown that electrical trees can be 3-D imaged. A 3-D virtual replica can be created and through it, the tree characteristics analysed. Laboratory created electrical trees in polymeric insulation were scanned using X-ray computed tomography (XCT) for 3-D model reconstructions. Here global parameters such as diameter of tree channels, tree surface and volume are determined. The fractal dimension from 2-D projected patterns are shown to be lower than the fractal dimension from the entire 3-D model for both bush and branchtype trees. Local parameters such as numbers of channels, area covered by them and proportion of area degraded at a given cross-section are also calculated. Using the skeleton for analysing the tree structure, indices such as number of vertices, segment length, vertex density, tortuosity and branch angle are presented. Among them, vertex density provides a marked difference in value between a bush and a branch-type electrical tree. Using this 3-D approach for analysis achieves a more complete insight into treeing phenomena.
  • Keywords
    computerised tomography; fractals; image reconstruction; polymer insulators; trees (electrical); 2D projected patterns; 3D imaged replica; 3D model reconstructions; 3D virtual replica; X-ray computed tomography; XCT; electrical trees; fractal dimension; geometric analysis; global parameters; polymeric insulation; three dimensional characterisation; tortuosity; tree channels; tree structure; tree surface; vertex density; Fractals; Insulation; Plastics; Scanning electron microscopy; Vegetation; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
  • Conference_Location
    Shenzhen
  • Type

    conf

  • DOI
    10.1109/CEIDP.2013.6748152
  • Filename
    6748152