DocumentCode
3388958
Title
Three dimensional characterisation of electrical trees
Author
Schurch, Roger ; Rowland, S. ; Bradley, Robert S. ; Withers, Philip J.
Author_Institution
Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester, UK
fYear
2013
fDate
20-23 Oct. 2013
Firstpage
494
Lastpage
497
Abstract
Most of the geometric analysis of the structure of electrical trees has been performed using a two-dimensional (2-D) approach. However, electrical trees grow three-dimensionally (3D). The authors have recently shown that electrical trees can be 3-D imaged. A 3-D virtual replica can be created and through it, the tree characteristics analysed. Laboratory created electrical trees in polymeric insulation were scanned using X-ray computed tomography (XCT) for 3-D model reconstructions. Here global parameters such as diameter of tree channels, tree surface and volume are determined. The fractal dimension from 2-D projected patterns are shown to be lower than the fractal dimension from the entire 3-D model for both bush and branchtype trees. Local parameters such as numbers of channels, area covered by them and proportion of area degraded at a given cross-section are also calculated. Using the skeleton for analysing the tree structure, indices such as number of vertices, segment length, vertex density, tortuosity and branch angle are presented. Among them, vertex density provides a marked difference in value between a bush and a branch-type electrical tree. Using this 3-D approach for analysis achieves a more complete insight into treeing phenomena.
Keywords
computerised tomography; fractals; image reconstruction; polymer insulators; trees (electrical); 2D projected patterns; 3D imaged replica; 3D model reconstructions; 3D virtual replica; X-ray computed tomography; XCT; electrical trees; fractal dimension; geometric analysis; global parameters; polymeric insulation; three dimensional characterisation; tortuosity; tree channels; tree structure; tree surface; vertex density; Fractals; Insulation; Plastics; Scanning electron microscopy; Vegetation; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena (CEIDP), 2013 IEEE Conference on
Conference_Location
Shenzhen
Type
conf
DOI
10.1109/CEIDP.2013.6748152
Filename
6748152
Link To Document