DocumentCode
3389387
Title
Optimized statistical analog fault simulation
Author
Khouas, Abdelhakim ; Dessouky, Mohamed ; Derieux, Anne
Author_Institution
Univ. Pierre et Marie Curie, Paris, France
fYear
1999
fDate
1999
Firstpage
227
Lastpage
232
Abstract
A new statistical method for analog fault simulation is presented. The method takes into account process parameter variations and aims to reduce the number of the computational expensive Monte Carlo simulations often required during analog fault simulation. The technique is illustrated by means of a fifth-order low-pass switched-capacitor filter
Keywords
Monte Carlo methods; analogue integrated circuits; circuit analysis computing; fault simulation; integrated circuit testing; statistical analysis; switched capacitor filters; Monte Carlo simulations; fault simulation algorithm; fifth-order SC filter; low-pass SC filter; optimized fault simulation; process parameter variations; statistical analog fault simulation; switched-capacitor filter; Analog circuits; Analog integrated circuits; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Statistics; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1999. (ATS '99) Proceedings. Eighth Asian
Conference_Location
Shanghai
ISSN
1081-7735
Print_ISBN
0-7695-0315-2
Type
conf
DOI
10.1109/ATS.1999.810755
Filename
810755
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