DocumentCode
33903
Title
Toolchain-based approach to handling variability in embedded multiprocessor system on chips
Author
Gray, Ian ; Plumbridge, Gary ; Audsley, Neil C.
Author_Institution
Comput. Sci. Dept., Univ. of York, York, UK
Volume
9
Issue
1
fYear
2015
fDate
1 2015
Firstpage
82
Lastpage
92
Abstract
Manufacturing variability is an increasingly significant problem. Silicon devices that are designed to be identical will display widely ranging characteristics after manufacture. Power use, supported clock frequencies and lifespan may all vary considerably. This is of particular concern for embedded systems because of their extensive use of complex system-on-chip (SoC)-based architectures. If this variability is not tolerated by the software, then manufacturing yields are reduced and devices are not used efficiently. This study discusses a novel approach to the integration of variability-mitigation techniques that uses model-driven engineering to explicitly consider variability as part of the development process. Developers can build systems that are much more resilient to variability effects, allowing systems to have higher yields, lower costs and greater reliability. The approach uses code generation and code transformation to simplify design-space exploration and reduce time-to-market. The approach is illustrated with an example of audio processing on a complex multiprocessor SoC with simulated variability, and it is shown to be increasingly effective as system variability becomes more significant.
Keywords
embedded systems; multiprocessing systems; program compilers; software engineering; system-on-chip; SoC-based architectures; clock frequency; code generation; code transformation; complex system-on-chip; design-space exploration; embedded multiprocessor system on chips; manufacturing variability; manufacturing yields; model-driven engineering; silicon devices; time-to-market reduction; tool chain-based approach; variability-mitigation techniques;
fLanguage
English
Journal_Title
Computers & Digital Techniques, IET
Publisher
iet
ISSN
1751-8601
Type
jour
DOI
10.1049/iet-cdt.2014.0070
Filename
7018744
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