• DocumentCode
    3390533
  • Title

    Current-limited passive charge recovery for implantable neuro-stimulators: Power savings, modelling and characterisation

  • Author

    Lehmann, Torsten ; Chun, Hosung ; Preston, Phil ; Suaning, Gregg

  • Author_Institution
    Sch. of Electr. Eng. & Telecommun., Univ. of New South Wales, Sydney, NSW, Australia
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    3128
  • Lastpage
    3131
  • Abstract
    In this paper, we investigate a passive charge recovering stimulation strategy that can potentially halve the stimulation power consumption in implantable neuro-stimulators. We propose a simple circuit implementation and an electrode-tissue interface model and use this to simulate average electrode currents and electrode resting potentials over a range of stimulation and electrode parameters. We compare said measures with same for a capacitively coupled stimulation strategy and a post-stimulation electrode shortening strategy finding that the passive charge recovering strategy is comparable to post-stimulation shortening. The simulations are confirmed with in-vitro measurements in physiological saline.
  • Keywords
    biomedical electrodes; biomedical electronics; low-power electronics; neurophysiology; power consumption; prosthetics; capacitively coupled stimulation strategy; current-limited passive charge recovery; electrode currents; electrode resting potentials; electrode-tissue interface model; implantable neurostimulators; passive charge recovering stimulation strategy; post-stimulation electrode shortening strategy; power savings; stimulation power consumption; Australia; Biomedical engineering; Biomedical measurements; Circuit simulation; Electrodes; Impedance; Implants; In vitro; Power dissipation; Voltage control; Biomedical Implants; Charge Balance; Low-power Circuits; Platinum Electrodes; Safe Stimulation of Nerves; Vision Prostheses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537962
  • Filename
    5537962