Title :
Test program development using multiple test strategies
Author :
Robinson, Gordon D.
Author_Institution :
Genrad Inc., Concord, MA, USA
Abstract :
Multistrategy testing allows the test developer to choose the appropriate combination of test approaches to meet the test requirements given the economic and timescale constraints. After describing the goals of test program development, the author discusses major styles of testing, connectivity tests, digital and analog functional tests, analog and digital in-circuit tests, emulation tests, and structured design for testability. Other issues considered are architecture support for multistrategy testing, modular test structures, and separate test execution and diagnosis
Keywords :
automatic test equipment; automatic testing; electronic equipment testing; ATE; analog functional tests; architecture support; connectivity tests; digital in-circuit tests; economic constraints; electronic equipment testing; emulation tests; modular test structures; multiple test strategies; multistrategy testing; structured design for testability; test program development; timescale constraints; Automatic testing; Costs; Databases; Electronic equipment testing; Fault detection; Fault diagnosis; Programming profession; Software systems; Software testing; System testing;
Conference_Titel :
AUTOTESTCON '89. IEEE Automatic Testing Conference. The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.
Conference_Location :
Philadelphia, PA
DOI :
10.1109/AUTEST.1989.81092
