DocumentCode :
3394357
Title :
Optimizing the energy-delay-ringing product in on-chip CMOS line drivers
Author :
Abbaspour, Soroush ; Pedram, Massoud ; Heydari, Payam
Author_Institution :
Dept. of Electr. Eng.-Syst., Southern California Univ., Los Angeles, CA, USA
fYear :
2003
fDate :
24-26 March 2003
Firstpage :
261
Lastpage :
266
Abstract :
This paper presents a detailed empirical study and analytical derivation of voltage waveform and energy dissipation of global lines driven by CMOS drivers. It is shown that at high clock frequencies where the output voltage at the termination point of the transmission line may not reach its steady state value during the clock period, it is possible to reduce energy dissipation while meeting a DC noise margin by driver sizing. This is in sharp contrast with the steady state analysis, which states that driver size has no impact on the energy dissipation per output change. In addition, we propose a new design metric which is the product of energy, delay and some measure of ringing in lossy transmission lines. In particular, this paper provides closed-form expressions for the energy dissipation, 50% propagation delay and the percentage of maximum undershoot when the circuit exhibits an under-damped behavior. This metric is used during the driver sizing problem formulation for minimum energy-delay-ringing product.
Keywords :
CMOS integrated circuits; ULSI; delays; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; transmission line theory; CMOS drivers; DC noise margin; ULSI circuits; clock frequencies; closed form expressions; design metric; driver sizing; energy delay ringing product optimisation; global lines; interconnect energy dissipation; lossy transmission lines; on chip CMOS line drivers; propagation delay; steady state value; under-damped behavior; voltage waveform; Clocks; Delay; Energy dissipation; Energy measurement; Frequency; Noise reduction; Steady-state; Transmission line measurements; Transmission lines; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2003. Proceedings. Fourth International Symposium on
Print_ISBN :
0-7695-1881-8
Type :
conf
DOI :
10.1109/ISQED.2003.1194743
Filename :
1194743
Link To Document :
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