The charge carrier trap energy levels of two different polyimide films characterized by three methods

Author

Zhang, Peihong ; Wang, Xuan ; Yang, Chun ; Lei, Qingquan

Author_Institution

Key Lab. of Eng. Dielectric & Its Applic., Harbin Univ. of Sci. & Technol., Harbin, China

fYear

2009

fDate

19-23 July 2009

Firstpage

891

Lastpage

894

Abstract

The charge carrier trap energy level is an important parameter that will affect the electrical and optical properties of insulating and semiconducting materials. Depending on the characterizing methods, it has a remarkable difference. The trap energy levels of two kinds of polyimide films, original (100 HN) and corona-resistant (100 CR) ones produced by Dupont, are estimated by depolarization current, space charge limited current and thermally stimulated current method. The corresponding values are 1.185 eV-1.200 eV and 1.168 eV-1.220 eV, 0.93 eV and 0.76 eV, 0.65-0.91 eV and 0.60-0.90 eV, respectively. These results show that the trap energy level of polymers comes significantly under the influence of heating procedures, and the shallower traps are constructed in corona-resistant polyimide film.

Keywords

energy states; polymer films; space charge; charge carrier trap energy levels; depolarization current; insulating materials; polyimide films; semiconducting materials; space charge limited current; thermally stimulated current method; Charge carrier processes; Charge carriers; Dielectrics and electrical insulation; Energy states; Optical films; Polyimides; Polymer films; Semiconductivity; Semiconductor films; Stimulated emission;

fLanguage

English

Publisher

ieee

Conference_Titel

Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the

Conference_Location

Harbin

Print_ISBN

978-1-4244-4367-3

Electronic_ISBN

978-1-4244-4368-0

Type

conf

DOI

10.1109/ICPADM.2009.5252239

Filename

5252239