• DocumentCode
    3395929
  • Title

    Simulation of worst case switching noise on a DDR2 interface

  • Author

    Mandrekar, R. ; Harvey, P.M. ; Kuruts, J. ; Dreps, Daniel ; Ozguner, T. ; Yaping Zhou

  • Author_Institution
    Kazushige Kawasaki, IBM Corp., Austin, TX
  • fYear
    2008
  • fDate
    27-29 Oct. 2008
  • Firstpage
    87
  • Lastpage
    90
  • Abstract
    This paper describes a new technique to simulate worst case simultaneous switching noise on a DDR2 interface. The paper focuses on how the impedance response of the power distribution network can be used in determining an excitation pattern that results in the worst case switching noise on the interface.
  • Keywords
    distribution networks; electric impedance; integrated memory circuits; noise; DDR2 interface; excitation pattern; impedance response; power distribution network; switching noise; Circuit simulation; Driver circuits; Impedance; Noise generators; Noise level; Power systems; Rails; Resonance; Resonant frequency; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2008 IEEE-EPEP
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2873-1
  • Type

    conf

  • DOI
    10.1109/EPEP.2008.4675884
  • Filename
    4675884
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3395929