DocumentCode
3396445
Title
VCSEL-based smart pixels
Author
Matsuo, S. ; Kurokawa, T.
Author_Institution
NTT Opto-Electron. Labs., Kanagawa, Japan
fYear
1996
fDate
5-9 Aug. 1996
Firstpage
3
Lastpage
4
Abstract
Smart pixels incorporating vertical-cavity surface-emitting lasers (VCSELs) have shown great potential for use in optical computing systems and photonic switching networks because the integration of the VCSEL makes optical circuits easy to construct. We have developed integration with a VCSEL, MESFETs, and a metal-semiconductor-metal (MSM) photodetector. In this device, both NOR- and OR-types of operation can be performed with the same circuit. The device operated at a high contrast ratio of more than 30 dB with optical gain. It also showed the 3-dB bandwidth of 220 MHz with 300-/spl mu/W input power. We recently proposed a novel structure that uses three-dimensional integration of the compound semiconductor thin-film and a silicon circuit. The VCSEL and photodetector layers are bonded onto a silicon circuit using polyimide. This method does not require any alignment before wafer bonding. The fabrication process for the photonic circuit is the same technology that is used in our monolithic integrated smart pixel, so it facilitates a wafer-scale fabrication process. To demonstrate this technology, we fabricated an MSM photodetector on a silicon substrate.
Keywords
CMOS integrated circuits; MESFET integrated circuits; integrated optoelectronics; laser cavity resonators; metal-semiconductor-metal structures; optical logic; photodetectors; smart pixels; surface emitting lasers; wafer bonding; 220 MHz; 300 muW; MESFET; MSM photodetector; NOR-type; OR-type; Si; Si substrate; VCSEL-based smart pixels; bandwidth; high contrast ratio; input power; integration; metal-semiconductor-metal; monolithic integrated smart pixel; optical circuits; optical computing; optical gain; photodetector layers; photonic circuit; photonic switching networks; polyimide; silicon circuit; vertical-cavity surface-emitting lasers; wafer bonding; wafer-scale fabrication process; Fabrication; Integrated circuit technology; Optical computing; Photodetectors; Silicon; Smart pixels; Surface emitting lasers; Switching circuits; Vertical cavity surface emitting lasers; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Applications of Lasers in Materials Processing/Broadband Optical Networks/Smart Pixels/Optical MEMs and Their Applications. IEEE/LEOS 1996 Summer Topical Meetings:
Conference_Location
Keystone, CO, USA
Print_ISBN
0-7803-3175-3
Type
conf
DOI
10.1109/LEOSST.1996.540718
Filename
540718
Link To Document