• DocumentCode
    3397344
  • Title

    Effect of different dopant in machinable ceramic on its surface flashover characteristics in vacuum

  • Author

    Yu, Kaikun ; Zheng, Nan ; Tian, Jie ; Liu, Guoqing ; Zhang, Guanjun

  • Author_Institution
    State Key Lab. of Electr. Insulation & Power Equip., Xian Jiaotong Univ., Xi´´an, China
  • fYear
    2009
  • fDate
    19-23 July 2009
  • Firstpage
    717
  • Lastpage
    720
  • Abstract
    As well known, the secondary electron emission yield is one important factor for the flashover phenomena of solid materials under high electric field in vacuum. On the basis of the novel low melting temperature machinable glass ceramics for vacuum insulation system, which has excellent machinable performance and good electrical properties, different low SEE yield metal oxides including Cu2O and Cr2O3 were doped into the original glass ceramics to investigate the effects of different process technology on the surface flashover phenomena of the machinable ceramics under pulse voltage in vacuum. We found that after doping the metal oxide, the samples´ surface flashover voltage has changed. Experimental results revealed that after doping metal oxide into the machinable ceramic, the sample´s SEE yield relatively reduced.
  • Keywords
    aluminosilicate glasses; borosilicate glasses; chromium compounds; copper compounds; doping; flashover; fluorine; glass ceramics; insulating materials; magnesium compounds; secondary electron emission; zinc compounds; SiO2-B2O3-Al2O3-ZnO-MgO-F-Cu2O-Cr2O3; doping; electrical properties; glass ceramics; machinable ceramic; secondary electron emission; surface flashover; Ceramics; Doping; Electron emission; Flashover; Glass; Solids; Temperature; Vacuum systems; Vacuum technology; Voltage; SEE yield; flashover; machinable ceramic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-4367-3
  • Electronic_ISBN
    978-1-4244-4368-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.2009.5252328
  • Filename
    5252328