DocumentCode
3397552
Title
Elimination of parasitic generation in power X-band internally matched transistors with high associated gain
Author
Galdetskiy, A.V. ; Manchenko, L.V. ; Pashkovskii, A.B. ; Pchelin, V.A.
Author_Institution
Fed. State Unitary Corp. R&PC, Fryazino
fYear
2008
fDate
8-12 Sept. 2008
Firstpage
75
Lastpage
76
Abstract
Stability problems for X-band internally matched HEMTpsilas with output power higher than 10 W, associated gain higher than 13 dB are discussed. Several variants of schematic design for parasitic generation elimination are proposed.
Keywords
amplification; power HEMT; stability; associated gain; parasitic generation; power X-band internally matched HEMT; schematic design; stability; Crops; Helium; IEEE catalog; Microwave technology; Organizing; Power amplifiers; Power generation; Topology;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location
Sevastopol, Crimea
Print_ISBN
978-966-335-166-7
Electronic_ISBN
978-966-335-169-8
Type
conf
DOI
10.1109/CRMICO.2008.4676297
Filename
4676297
Link To Document