• DocumentCode
    3397657
  • Title

    Mechanism and characteristic of dielectric barrier multi-pulse glow discharge in helium at atmospheric pressure

  • Author

    Yang, Lin ; Hao, Yanpeng ; Tu, Enlai ; Wang, Xiaolei ; Chen, Jianyang

  • Author_Institution
    Sch. of Electr. Power, South China Univ. of Technol., Guangzhou, China
  • fYear
    2009
  • fDate
    19-23 July 2009
  • Firstpage
    655
  • Lastpage
    658
  • Abstract
    Modes of dielectric barrier multi-pulse discharge were investigated under an 11.85 kHz voltage in helium at atmospheric pressure based on a fast-gated intensified charge coupled device (ICCD) camera. Electrical parameters of gas gap were calculated via the simplified circuit of dielectric barrier discharge for discussing the forming reason of multi-pulse discharge. The discharge evolution photographs show that physical process of the first pulse in an atmospheric helium multi-pulse discharge is from Townsend discharge to glow discharge, and that of the other subsequent current pulses is glow discharge. Discharge gap still maintains a weak glow discharge in the interval time between two consecutive current pulses. Experimental observations and simulation results are in good agreement. Multi-pulse discharge is proved to be the glow discharge and a co-evolution result of both surface charges and the applied voltage.
  • Keywords
    glow discharges; helium; surface discharges; He; atmospheric pressure; dielectric barrier discharge; dielectric barrier multi pulse glow discharge; discharge evolution photograph; discharge gap; fast gated intensified charge coupled device; frequency 11.85 kHz; helium; surface charge; Atmospheric modeling; Ceramics; Charge-coupled image sensors; Dielectric devices; Electrodes; Fault location; Glow discharges; Helium; Surface discharges; Voltage; ICCD; dielectric barrier discharge; glow discharge; multi-pulse discharge; surface charge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-4367-3
  • Electronic_ISBN
    978-1-4244-4368-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.2009.5252344
  • Filename
    5252344