• DocumentCode
    3397906
  • Title

    Mechanism on breakdown phenomenon of cable joint with impurities

  • Author

    Chen, Chengwei ; Liu, Gang ; Lu, Guojun ; Wang, Jin

  • Author_Institution
    Sch. of Electr. Power, South China Univ. of Technol., Guangzhou, China
  • fYear
    2009
  • fDate
    19-23 July 2009
  • Firstpage
    595
  • Lastpage
    597
  • Abstract
    The electric-field intensity around the cable joint is computed based on the finite element method when the power cable is loaded on the 110 kV constant voltage source. If there are impurities in the cable joint, the impurities would cause the local electrical field distorted and the electric-field intensity increasing sharp. The insulation materials are breakdown when the local electrical field is distorted for the intensity exceeding the dielectric strength possibly. To analyze the mechanism on breakdown phenomenon mathematical models are established according to cable joint with impurities, and the distribution of the electric-field intensity on the models is computed when loaded on the 110 kV constant voltage source. In the test, cable joint with impurities run on different constant voltage source. The result shows the discharge path in the cable joint with impurities.
  • Keywords
    cable jointing; electric breakdown; impurities; breakdown phenomenon; cable joint; constant voltage source; electric-field intensity; impurities; voltage 110 kV; Breakdown voltage; Dielectric breakdown; Dielectric materials; Dielectrics and electrical insulation; Electric breakdown; Finite element methods; Impurities; Mathematical model; Power cable insulation; Power cables; electrostatic field; finite element method; impurity; mechanism on breakdown; power cable´s joint;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-4367-3
  • Electronic_ISBN
    978-1-4244-4368-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.2009.5252358
  • Filename
    5252358