Title :
Flicker noise simulation in mixer circuit on MOSFET
Author :
Krizhanovski, V.V. ; Rassokhina, Yu.V. ; Krizhanovski, V.G. ; Bondarev, B.V.
Author_Institution :
Inf. & Commun. Univ., Daejeon
Abstract :
On the basis of random trapping and detrapping process of charges in oxide traps the flicker noise ( 1 / f ) model was proposed.
Keywords :
MOSFET; flicker noise; mixers (circuits); MOSFET; flicker noise simulation; mixer circuit; random trapping; 1f noise; Circuit simulation; IEEE catalog; MOSFET circuits; Microwave technology; Organizing;
Conference_Titel :
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
978-966-335-166-7
Electronic_ISBN :
978-966-335-169-8
DOI :
10.1109/CRMICO.2008.4676321
