DocumentCode
3398007
Title
A PHYSICAL MODEL OF THE ELECTRICAL BREAKDOWN IN HIGH FIELD SEMICONDUCTOR- DIELECTRIC SYSTEMS
Author
Gradinaru, G. ; Sudarshan, T.S.
fYear
1992
fDate
23-25 Jun 1992
Firstpage
331
Keywords
Breakdown voltage; Condition monitoring; Dielectric breakdown; Electric breakdown; Flashover; Metallization; Semiconductor device breakdown; Surface discharges; System analysis and design; Time factors;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Modulator Symposium, 1992. Conference Record of the 1992 Twentieth
Print_ISBN
0-7803-0718-6
Type
conf
DOI
10.1109/MODSYM.1992.492637
Filename
492637
Link To Document