• DocumentCode
    3398019
  • Title

    The investigation on tracking failure of gamma-ray irradiated Polyphenylene Oxide

  • Author

    Du, B.X. ; Liu, H.J. ; Wang, X.H. ; Zhang, Xiangjin

  • Author_Institution
    Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China
  • fYear
    2009
  • fDate
    19-23 July 2009
  • Firstpage
    565
  • Lastpage
    568
  • Abstract
    The effect of gamma-ray irradiation on dielectric breakdown of polyphenylene oxide under magnetic field was investigated. The experiment was carried out by applying a dc pulse voltage under magnetic field. The magnetic flux density (MFD) of the magnetic filed was 495 mT. The samples were irradiated in air up to 100 kGy and then up to 1000 kGy with a dose rate of 10 kGy/h by using a 60Co gamma-source. The time to dielectric breakdown and the discharge quantity of discharge current were discussed. Because the data of tracking resistance obtained from the test has a wide variation, a recurrence plot analysis of discharge current has been made to evaluate the tracking failure more consistently. The effects of the irradiation and magnetic filed on the tracking failure can be visually identified by the recurrence plot.
  • Keywords
    electric breakdown; gamma-ray effects; magnetic field effects; magnetic flux; dc pulse voltage; dielectric breakdown; discharge quantity; gamma ray irradiation; magnetic field; magnetic flux density; polyphenylene oxide; tracking failure; Dielectric breakdown; Dielectric materials; Dielectrics and electrical insulation; Electrodes; Insulation life; Magnetic fields; Needles; Polymers; Surface discharges; Testing; dielectric breakdown; gamma-ray irradiation; magnetic field; recurrence plot;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4244-4367-3
  • Electronic_ISBN
    978-1-4244-4368-0
  • Type

    conf

  • DOI
    10.1109/ICPADM.2009.5252364
  • Filename
    5252364