Title :
Automation challenges in the next generation semiconductor factory
Author :
Subramaniam, Bala ; Kryder, Kenneth D.
Author_Institution :
Intel Corp., Chandler, AZ, USA
Abstract :
This paper describes the evolution of the 200 mm generation of automated material handling systems in Intel´s semiconductor fabrication facilities. We describe the benefits and challenges in implementing and maintaining these systems. The 300 mm generation of fabrication facilities present some new challenges and opportunities for lowering capital and operational cost while providing for better flexibility through automation. We believe that increased standardization and synergistic design of process equipment, building, operational methodologies and automation systems is required for meeting these new challenges. We conclude by presenting some engineering ideas and design management processes that represent work in progress to meet this objective. We hope to generate discussion and motivate applied research in universities on ideas and equipment that would support cost effective proliferation of automated material handling in the semiconductor industry
Keywords :
design engineering; economics; factory automation; integrated circuit manufacture; materials handling; production engineering computing; semiconductor device manufacture; technological forecasting; 200 to 300 mm; Intel; automated material handling system; building; capital; engineering; flexibility; management; next generation semiconductor factory; operational cost; operational methodology; process equipment; semiconductor fabrication facility; standardization; synergistic design; Buildings; Costs; Design automation; Design engineering; Fabrication; Manufacturing automation; Materials handling; Process design; Production facilities; Standardization;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1997. IEEE/SEMI
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-4050-7
DOI :
10.1109/ASMC.1997.630761