Title :
Invasive PUF Analysis
Author :
Nedospasov, Dmitry ; Seifert, Jean-Pierre ; Helfmeier, Clemens ; Boit, Christian
Author_Institution :
Dept. of Software Eng. & Theor. Comput. Sci., Tech. Univ. Berlin, Berlin, Germany
Abstract :
In this work we consider the suitability of Phyiscaly Unclonable Functions (PUFs) for high-security applications. For PUFs to be considered secure in such scenarios they must be resilient to both semi-invasive and fully-invasive attacks. We introduce a new failure analysis technique for semi-invasive, single-trace, backside readout of logic states. We apply this technique to characterize the unique physical response of a memory-based PUF. With these results we identify several weakness in current PUF schemes. We extend current PUF definitions to be resilient against such attacks by requiring that PUFs be implemented in a serialized manner. Finally, we improve already existing PUF architectures to include these concepts.
Keywords :
SRAM chips; failure analysis; integrated circuit reliability; integrated circuits; security of data; backside readout; failure analysis technique; fully-invasive attacks; high-security applications; invasive PUF analysis; memory-based PUF; modern secure integrated circuits; nonvolatile memory; physically unclonable functions; secure storage; semi-invasive attacks; semi-invasive readout; single-trace readout; Integrated circuits; Inverters; Lasers; Logic gates; Random access memory; Silicon; Transistors; Fully-invasive; IC security; Laser characterization; PUF; Semi-invasive; Tamper-evidence;
Conference_Titel :
Fault Diagnosis and Tolerance in Cryptography (FDTC), 2013 Workshop on
Conference_Location :
Santa Barbara, CA
Print_ISBN :
978-0-7695-5059-6
DOI :
10.1109/FDTC.2013.19