• DocumentCode
    33990
  • Title

    Semi-Supervised Kernel Mean Shift Clustering

  • Author

    Anand, Sruthy ; Mittal, Sparsh ; Tuzel, Oncel ; Meer, Peter

  • Author_Institution
    Electr. & Comput. Eng. Dept., Rutgers Univ., Piscataway, NJ, USA
  • Volume
    36
  • Issue
    6
  • fYear
    2014
  • fDate
    Jun-14
  • Firstpage
    1201
  • Lastpage
    1215
  • Abstract
    Mean shift clustering is a powerful nonparametric technique that does not require prior knowledge of the number of clusters and does not constrain the shape of the clusters. However, being completely unsupervised, its performance suffers when the original distance metric fails to capture the underlying cluster structure. Despite recent advances in semi-supervised clustering methods, there has been little effort towards incorporating supervision into mean shift. We propose a semi-supervised framework for kernel mean shift clustering (SKMS) that uses only pairwise constraints to guide the clustering procedure. The points are first mapped to a high-dimensional kernel space where the constraints are imposed by a linear transformation of the mapped points. This is achieved by modifying the initial kernel matrix by minimizing a log det divergence-based objective function. We show the advantages of SKMS by evaluating its performance on various synthetic and real datasets while comparing with state-of-the-art semi-supervised clustering algorithms.
  • Keywords
    learning (artificial intelligence); matrix algebra; pattern clustering; clustering procedure; initial kernel matrix; linear transformation; nonparametric technique; real datasets; semisupervised Kernel mean shift clustering; semisupervised clustering methods; semisupervised framework; synthetic datasets; underlying cluster structure; Clustering algorithms; Clustering methods; Computer vision; Null space; Symmetric matrices; Vectors; Algorithms; Applications; Clustering; Computer vision; Computing Methodologies; Pattern Recognition; Semi-supervised kernel clustering; Similarity measures; log det Bregman divergence; mean shift clustering;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2013.190
  • Filename
    6616555