DocumentCode :
3399852
Title :
Design of capacitance parameter measuring instrument based on virtual instrument
Author :
Zhu, Hui ; Jin, Lijun ; Shen, Xiaojun ; Shen, Yuzhuo ; Gu, Kai
Author_Institution :
Dept. of Electr. Eng., Tongji Univ., Shanghai, China
fYear :
2009
fDate :
19-23 July 2009
Firstpage :
1064
Lastpage :
1067
Abstract :
In this paper, a capacitance parameters of high-precision digital measuring instrument was designed, based on the VI (virtual instruments), using LabVIEW software platform and applying current comparison measuring principle. This system possesses current comparison based on Magnetic Potential Balance Principle, PC subject, the integrated data acquisition modules and I/0 control module. Magnetic potential balance has been achieved by controlling coil turns. With the function of PC, accurate test results have been gained. Because of using the closed-loop control and the successive approximation method to control relay, the system achieves equilibrium sharply. This system has been used to test the capacitance of capacitor, dielectric loss value and the inductance of reactor, which has advantages to more accuracy and stability, convenient operation, and adjusting quickly and a wide range of uses.
Keywords :
capacitance measurement; virtual instrumentation; capacitance parameter measuring instrument; capacitance parameters; high-precision digital measuring instrument; magnetic potential balance principle; virtual instrument; Approximation methods; Capacitance measurement; Coils; Control systems; Current measurement; Data acquisition; Dielectric losses; Instruments; Software measurement; Testing; current comparator; dielectric loss; virtual instruments;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-4367-3
Electronic_ISBN :
978-1-4244-4368-0
Type :
conf
DOI :
10.1109/ICPADM.2009.5252451
Filename :
5252451
Link To Document :
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