• DocumentCode
    3400611
  • Title

    Impact of SPM on Dispersion Compensated DPSK Transmission Link under Tight Optical Filtering

  • Author

    Gupta, S. ; Gangopadhyay, R. ; Prati, G.

  • Author_Institution
    Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur
  • fYear
    2006
  • fDate
    Sept. 2006
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The tolerance against self-phase modulation (SPM) of three differential phase-shift keying (DPSK) modulation schemes viz. conventional DPSK (CDPSK), symmetrical DPSK (SDPSK) and pi/4-DPSK in a 40-Gb/s multi-span dispersion compensated single-mode fiber (SMF) link is studied through detailed numerical simulation. The study takes into account the influence of pulse duty-ratio, tight optical filtering, in-line amplifier noise and the impact of delay mismatch in the delay-demodulation receiver while comparing the variants of DPSK systems. The numerical analysis clearly suggests the need for smaller duty ratio for all DPSK formats under tight optical filtering for achieving minimum eye-opening penalty (EOP) due to SPM. Return-to-zero (RZ)-CDPSK exhibits the highest tolerance towards the SPM induced penalty in noisy and noiseless situation whereas SDPSK shows more robustness to the uncertainty in the interferometer delay mismatch
  • Keywords
    differential phase shift keying; optical fibre communication; optical fibre dispersion; optical filters; self-phase modulation; SPM; differential phase-shift keying; dispersion compensated DPSK transmission link; in-line amplifier noise; optical filtering; return-to-zero CDPSK; self-phase modulation; Delay; Differential quadrature phase shift keying; Fiber nonlinear optics; Filtering; Nonlinear optics; Optical filters; Optical interferometry; Optical noise; Optical receivers; Scanning probe microscopy; Differential phase-shift keying (DPSK); optical fiber communication; optical modulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    India Conference, 2006 Annual IEEE
  • Conference_Location
    New Delhi
  • Print_ISBN
    1-4244-0369-3
  • Electronic_ISBN
    1-4244-0370-7
  • Type

    conf

  • DOI
    10.1109/INDCON.2006.302807
  • Filename
    4086278