Title :
A compact, low-cost, high-performance test fixture for electrical test and control of smart pixel integrated circuits
Author :
Kiamilev, Fouad ; Rozier, Richard ; Rieve, James
Author_Institution :
Dept. of Electr. Eng., North Carolina Univ., Charlotte, NC, USA
Abstract :
We have developed a low-cost, compact test fixture that can supply and monitor high-speed electrical signals for smart pixel ICs packaged in an 84-pin PGA chip carrier.
Keywords :
field programmable gate arrays; integrated circuit packaging; integrated circuit testing; integrated optoelectronics; monitoring; smart pixels; test equipment; PGA chip carrier; compact low-cost high-performance test fixture; electrical test; high-speed electrical signal monitoring; smart pixel IC packaging; smart pixel integrated circuit control; smart pixel integrated circuit testing; Circuit testing; Clocks; EPROM; Electronics packaging; Field programmable gate arrays; Fixtures; Hardware design languages; Integrated circuit testing; Smart pixels; Sockets;
Conference_Titel :
Advanced Applications of Lasers in Materials Processing/Broadband Optical Networks/Smart Pixels/Optical MEMs and Their Applications. IEEE/LEOS 1996 Summer Topical Meetings:
Conference_Location :
Keystone, CO, USA
Print_ISBN :
0-7803-3175-3
DOI :
10.1109/LEOSST.1996.540746
