• DocumentCode
    34010
  • Title

    Hardware Trojan Detection by Multiple-Parameter Side-Channel Analysis

  • Author

    Narasimhan, Sriram ; Dongdong Du ; Chakraborty, R.S. ; Paul, Sudipta ; Wolff, F.G. ; Papachristou, Christos A. ; Roy, Kaushik ; Bhunia, Swarup

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Case Western Reserve Univ., Cleveland, OH, USA
  • Volume
    62
  • Issue
    11
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    2183
  • Lastpage
    2195
  • Abstract
    Hardware Trojan attack in the form of malicious modification of a design has emerged as a major security threat. Sidechannel analysis has been investigated as an alternative to conventional logic testing to detect the presence of hardware Trojans. However, these techniques suffer from decreased sensitivity toward small Trojans, especially because of the large process variations present in modern nanometer technologies. In this paper, we propose a novel noninvasive, multiple-parameter side-channel analysisbased Trojan detection approach. We use the intrinsic relationship between dynamic current and maximum operating frequency of a circuit to isolate the effect of a Trojan circuit from process noise. We propose a vector generation approach and several design/test techniques to improve the detection sensitivity. Simulation results with two large circuits, a 32-bit integer execution unit (IEU) and a 128-bit advanced encryption standard (AES) cipher, show a detection resolution of 1.12 percent amidst ±20 percent parameter variations. The approach is also validated with experimental results. Finally, the use of a combined side-channel analysis and logic testing approach is shown to provide high overall detection coverage for hardware Trojan circuits of varying types and sizes.
  • Keywords
    cryptography; logic testing; AES cipher; Trojan circuit; advanced encryption standard; detection sensitivity; hardware Trojan detection; integer execution unit; logic testing approach; multiple-parameter side-channel analysis; nanometer technology; security threat; vector generation approach; Hardware; Integrated circuits; Logic testing; Noise; Payloads; Sensitivity; Trojan horses; Hardware security; hardware Trojan attack; logic testing; side-channel analysis;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2012.200
  • Filename
    6275439