DocumentCode
34017
Title
Cross-Coupled Current Conveyor Based CMOS Transimpedance Amplifier for Broadband Data Transmission
Author
Chen, D. ; Kiat Seng Yeo ; Xiaomeng Shi ; Manh Anh Do ; Chirn Chye Boon ; Wei Meng Lim
Author_Institution
Div. of Circuits & Syst., Nanyang Technol. Univ., Singapore, Singapore
Volume
21
Issue
8
fYear
2013
fDate
Aug. 2013
Firstpage
1516
Lastpage
1525
Abstract
This paper presents a novel cross-coupled current conveyor based CMOS transimpedance amplifier (TIA) design to obtain an input capacitive load insensitive and very low noise structure. The proposed structure is presented with an implementation in GlobalFoundries´ 0.18- μm 1.8-V industry compatible CMOS technology. The whole TIA circuit consumes only 31.5 mW of dc power. Measured results show a -3 dB bandwidth of about 4 GHz with a 0.25 pF photodiode capacitance. The single-ended transimpedance gain for positive output port is 46 dB Ω. The measured single-ended input-referred noise current spectral density is kept below 18 pA/√{Hz} within the TIA frequency band. The optical sensitivity for a bit-error-rate of 10-12 is -15 dBm with 4.25 Gb/s 231-1 proactive Reed-Solomon bypass data pattern. This cross-coupled structure also facilitates building an input-insensitive differential TIA. The simulation result shows a stable frequency response over a wide range of input capacitance from 0.05 to 0.5 pF.
Keywords
CMOS analogue integrated circuits; current conveyors; data communication; operational amplifiers; photodiodes; CMOS TIA design; CMOS transimpedance amplifier; GlobalFoundries industry compatible CMOS technology; bit error rate; broadband data transmission; cross-coupled current conveyor; frequency response; input capacitive load; input-insensitive differential TIA; low-noise structure; optical sensitivity; photodiode capacitance; power 31.5 mW; proactive Reed-Solomon bypass data pattern; single-ended input-referred noise current spectral density; single-ended transimpedance gain; size 0.18 mum; voltage 1.8 V; Bandwidth; CMOS integrated circuits; Capacitance; Impedance; Noise; Photodiodes; Transistors; Bandwidth enhancement; broadband; cross-coupled current conveyor; transimpedance amplifier;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2012.2211086
Filename
6423289
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