DocumentCode :
340196
Title :
Depletion voltage and charge collection for highly irradiated silicon microstrip detectors with various initial resistivities
Author :
Cannara, R. ; Dubbs, T. ; Hancock, J. ; Kroeger, W. ; Nissen, T. ; Onodera, M. ; Rowe, W.A. ; Sadrozinsk, H. F W ; Dezillie, B. ; Li, Z. ; Wang, Q.S. ; Zhao, L.J.
Author_Institution :
SCIPP, California Univ., Santa Cruz, CA, USA
Volume :
2
fYear :
1998
fDate :
1998
Firstpage :
852
Abstract :
We have irradiated p-on-n silicon microstrip detectors of initial bulk resistivity between 0.2 and 2.7 kΩ-cm with 55 MeV protons to fluences of 0.8, 2.2 and 11×1013 p/cm2 (equivalent to twice the fluence in high energy protons), and have measured the depletion voltage before and after irradiation using C-V methods. In addition, we have measured the charge collection of minimum ionization on a single strip with a fast amplifier as a function of bias voltage. We compare the depletion voltage deduced from both methods for samples with different initial resistivities
Keywords :
capacitance; p-n junctions; proton effects; silicon radiation detectors; 55 MeV; C-V methods; Si; bulk resistivity; charge collection; depletion voltage; fast amplifier; highly irradiated silicon microstrip detectors; minimum ionization; p-on-n silicon microstrip detectors; Capacitance-voltage characteristics; Charge measurement; Conductivity; Current measurement; Detectors; Energy measurement; Microstrip; Protons; Silicon; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
Conference_Location :
Toronto, Ont.
ISSN :
1082-3654
Print_ISBN :
0-7803-5021-9
Type :
conf
DOI :
10.1109/NSSMIC.1998.774305
Filename :
774305
Link To Document :
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