The DIRC front-end electronics chain for BaBar

Author

Bailly, P. ; Beigbeder, C. ; Bernier, R. ; Breton, D. ; Bonneaud, G. ; Caceres, T. ; Chase, R. ; Chauveau, J. ; Del Buono, L. ; Dohou, F. ; Ducorps, A. ; Gastaldi, F. ; Genat, J.F. ; Hrisoho, A. ; Imbert, P. ; Lebbolo, H. ; Matricon, P. ; Oxoby, G. ; Rena

Author_Institution

Lab. de Phys. Nucl. et de Hautes Energies, Paris VI/VII Univ., France

Volume

2

fYear

1998

fDate

1998

Firstpage

918

Abstract

Recent results from the front-end electronics of the Detector of Internally Reflected Cerenkov light (DIRC) for the BaBar experiment at SLAC (Stanford, USA) are presented. It measures to better than 1 ns the arrival time of Cerenkov photoelectrons, detected in a 11,000 phototubes array and their amplitude spectra. It mainly comprises 64-channel DIRC front-end boards (DFB) equipped with eight full-custom analog chips performing zero-cross discrimination with 2 mV threshold and pulse shaping, four full-custom digital TDC chips for timing measurements with 500 ps binning and a readout logic selecting hits in the trigger window, and DIRC crate controller cards (DCC) serializing the data collected from up to 16 DFBs onto a 1.2 Gb/s optical link. Extensive test results of the pre-production chips are presented, as well as system tests

Keywords

Cherenkov counters; analogue processing circuits; analogue-digital conversion; application specific integrated circuits; nuclear electronics; pulse shaping; readout electronics; BaBar; Cerenkov photoelectrons; DIRC crate controller cards; DIRC front-end boards; DIRC front-end electronics chain; Detector of Internally Reflected Cerenkov light; full-custom analog chips; full-custom digital TDC chips; pre-production chips; pulse shaping; readout logic; timing measurements; zero-cross discrimination; Logic; Performance evaluation; Photoelectricity; Pulse measurements; Pulse shaping methods; Semiconductor device measurement; Shape control; System testing; Time measurement; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE

Conference_Location

Toronto, Ont.

ISSN

1082-3654

Print_ISBN

0-7803-5021-9

Type

conf

DOI

10.1109/NSSMIC.1998.774320

Filename

774320