DocumentCode
3402611
Title
On the possibilities of automatic measurements of microwave parameters of MMIC on wafer in Istok
Author
Galdetskiy, A.V. ; Buvailyk, E.V. ; Vasiliev, V.I. ; Korolev, A.N.
Author_Institution
FSUE Istok, Fryazino
fYear
2008
fDate
8-12 Sept. 2008
Firstpage
719
Lastpage
719
Abstract
Some possibilities of the measuring of microwave characteristics of MMICpsilas and transistors on wafer are presented. The developed software gives opportunities to realize complicated scripts of measurements and testing.
Keywords
MMIC; microwave measurement; microwave transistors; Istok; MMIC; automatic measurements; microwave parameters; transistors; wafer; Helium; Histograms; IEEE catalog; MMICs; Microwave measurements; Microwave technology; Microwave transistors; Organizing; Software measurement; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location
Sevastopol, Crimea
Print_ISBN
978-966-335-166-7
Electronic_ISBN
978-966-335-169-8
Type
conf
DOI
10.1109/CRMICO.2008.4676571
Filename
4676571
Link To Document