• DocumentCode
    340272
  • Title

    Uranium pinhole collimators for I-131 SPECT brain tumor imaging

  • Author

    Tenney, C.R. ; Smith, M.F. ; Greer, K.L. ; Jaszczak, R.J.

  • Author_Institution
    Duke Univ. Med. Center, Durham, NC, USA
  • Volume
    2
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    1312
  • Abstract
    Pinhole apertures made of depleted uranium were evaluated for high-resolution SPECT brain tumor imaging of therapeutic doses (30-100 mCi) of intratumorally administered I-131 radiolabelled monoclonal antibodies. High resolution is required for imaging residual tumor tissue, although for therapeutic doses, collimator sensitivity is less important. The resolution of uranium and tungsten pinhole apertures was compared in planar and SPECT images of I-131 sources. The planar sensitivity was studied on- and off-axis. The on-axis planar resolution for uranium pinholes is higher than that of tungsten pinholes for all cases examined; full-width-half-max (FWHM) is narrower for a 3 mm uranium pinhole than for a 1 mm tungsten pinhole. Collimator sensitivity is higher for tungsten than for uranium, indicating significantly lower edge penetration for uranium than for tungsten. On-axis SPECT (14.4 cm radius) scans also show a higher resolution for a 2 mm uranium pinhole (7.8 mm FWHM) than for a 2 mm tungsten pinhole (9.5 mm FWHM). The background radiation from a uranium collimator (102 cts/sec) is acceptably low compared to expected clinical count rates
  • Keywords
    single photon emission computed tomography; 0.00003 to 0.0001 Ci; FWHM; I; SPECT; U; U pinhole apertures; U pinhole collimators; W; W pinhole apertures; brain tumor imaging; off-axis planar resolution; on-axis planar resolution; planar sensitivity; resolution; Apertures; Attenuation; Collimators; Electromagnetic scattering; High-resolution imaging; Lead; Neoplasms; Particle scattering; Spatial resolution; Tungsten;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-5021-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1998.774396
  • Filename
    774396