DocumentCode
3402872
Title
The method of measurements and dielectric parameters of the film materials at MM-wave range
Author
Parshin, V.V. ; Serov, E.A.
Author_Institution
Inst. of Appl. Phys., Russian Acad. of Sci., Nizhny Novgorod
fYear
2008
fDate
8-12 Sept. 2008
Firstpage
753
Lastpage
754
Abstract
For the MM and SubMM ranges, on the base of high-Q Fabry-Perot resonator the original method of dielectric parameters measurements of thin film materials (<lambda/2) which does not need the information about film thickness, is presented. The dielectric parameters of popular film materials like Teflon (PTFE), lavsan, Polyethylenterephthalat (PTFE) are presented. The essential difference of dielectric parameters of film and ldquobulkrdquo Teflon was found.
Keywords
Fabry-Perot resonators; dielectric measurement; millimetre wave materials; polymer films; PET; PTFE; Teflon; dielectric parameters; high-Q Fabry-Perot resonator; lavsan; millimeter-wave materials; polyethylene terephthalate; thin films; Dielectric materials; Dielectric measurements; Helium; Tellurium;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location
Sevastopol, Crimea
Print_ISBN
978-966-335-166-7
Electronic_ISBN
978-966-335-169-8
Type
conf
DOI
10.1109/CRMICO.2008.4676587
Filename
4676587
Link To Document