Title :
A method for wave spectra refraction analysis by TOPSAR polarised data
Author_Institution :
Fac. of Sci. & Environ. Studies, Univ. Putra Malaysia, Malaysia
Abstract :
The refraction of waves is a phenomenon in which the energy is transferred laterally along the wave crest and it occurs when a chain of waves is interrupted by bottom topography. In case of the coastal process, the study of wave refraction is very important in understanding the erosion-sedimentation process. This paper presents work done utilizing TOPSAR polarised data to investigate the wave refraction pattern along the coastal water of Kuala Terengganu, Malaysia. For this purpose, a 2-D FFT was applied with a selective window size of 100×100 pixels and lines to represent wave spectra refraction pattern. The quasi-linear model was used to map TOPSAR wave refraction spectra into the real ocean wave spectra. Wave spectra information such as wavelength and wave directions are used to predict refraction based on Huygen´s principle. The wave spectra refraction pattern from TOPSAR polarised data is compared with the results from the wave refraction model and quasi-linear model. The statistical analysis of the quasi-linear model and wave refraction spectra model shows a good correlation. It can be concluded that TOPSAR polarised data has potential for monitoring the wave spectra refraction pattern. The integration of the quasi-linear model is more useful to identify the wave spectra refraction pattern
Keywords :
ocean waves; oceanographic techniques; radar imaging; radar polarimetry; remote sensing by radar; synthetic aperture radar; 2-D FFT; Gulf of Thailand; Huygen´s principle; Kuala Terengganu; Malaysia; South China Sea; TOPSAR polarised data; bottom topography; coastal process; erosion-sedimentation process; quasi-linear model; refraction pattern; statistical analysis; wave crest; wave directions; wave spectra refraction analysis; Azimuth; Electrokinetics; Monitoring; Ocean waves; Polarization; Radar imaging; Radar remote sensing; Sea measurements; Statistical analysis; Surfaces;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 1999. IGARSS '99 Proceedings. IEEE 1999 International
Conference_Location :
Hamburg
Print_ISBN :
0-7803-5207-6
DOI :
10.1109/IGARSS.1999.774609