Characterizing the stress applied to ICs by different ESD tester circuits

Author

Boxleitner, Warren ; Richman, Peter ; Weil, G.

Author_Institution

KeyTek Instrum. Corp., Wilmington, MA, USA

fYear

1990

fDate

21-23 Aug 1990

Firstpage

258

Lastpage

264

Abstract

It is recommended that the output current waveforms of ESD (electrostatic discharge) simulators for ICs be specified into a short circuit and 500 ohm load in order to insure that equivalent tests are being performed. Because this recommendation has not been in force, two alternatives have been proposed for the MIL-STD 883c ESD test circuit, which were found to differ by more than 30% from that circuit. It is strongly recommended that all future ESD test standards adopt the practice of specifying realistic ESD waveforms into at least two different loads in order to insure that tests are both repeatable and realistic

Keywords

electrostatic discharge; integrated circuit testing; measurement standards; standards; test equipment; ESD test standards; ESD tester circuits; IC testing; MIL-STD 883c ESD test circuit; electrostatic discharge; output current waveforms; stress; Breakdown voltage; Circuit simulation; Circuit testing; Clamps; Electrostatic discharge; Protection; Silicon; Stress; Temperature; Thermal conductivity;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on

Conference_Location

Washington, DC

Print_ISBN

0-7803-7264-6

Type

conf

DOI

10.1109/ISEMC.1990.252770

Filename

252770