• DocumentCode
    3407010
  • Title

    Fabrication of ridge waveguides from sol-gel derived Nd-doped SiO 2-TiO2-Al2O3 glass films

  • Author

    Xiang, Q. ; Zhou, Y. ; Ooi, B.S. ; Lam, Y.L. ; Chan, Y.C. ; Kam, C.H.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    820
  • Abstract
    Rare earth doped glass waveguide amplifiers are being actively researched because of their potential applications in DWDM networks. We have fabricated ridge channels from sol-gel derived Nd-doped SiO2 -TiO2-Al2O3 glass films using laser writing lithography and reactive ion etching (RIE). The SEM pictures show that the ridge is properly formed according to our design. The top surface of the ridge is smooth as a result of the Ti and Ni cap protection. However, the side-wall and the etched substrate are much rougher. We believe that the side-wall can be smoothed by re-annealing the channel and the propagation loss can be further reduced by burying the channel through depositing an upper cladding layer around the ridge
  • Keywords
    aluminosilicate glasses; integrated optics; neodymium; optical fabrication; optical films; optical glass; optical losses; optical waveguides; photolithography; ridge waveguides; scanning electron microscopy; sol-gel processing; sputter etching; waveguide lasers; DWDM networks; Ni; Ni cap protection; SEM pictures; SiO2-TiO2-Al2O3:Nd; Ti; Ti cap protection; etched substrate; fabrication; laser writing lithography; propagation loss; rare earth doped glass waveguide amplifiers; re-annealing; reactive ion etching; ridge waveguides; side-wall; sol-gel derived Nd-doped SiO2-TiO2-Al2 O3 glass films; top surface; upper cladding layer; Etching; Glass; Lithography; Optical device fabrication; Protection; Rough surfaces; Surface roughness; Waveguide lasers; Wavelength division multiplexing; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    LEOS '99. IEEE Lasers and Electro-Optics Society 1999 12th Annual Meeting
  • Conference_Location
    San Francisco, CA
  • ISSN
    1092-8081
  • Print_ISBN
    0-7803-5634-9
  • Type

    conf

  • DOI
    10.1109/LEOS.1999.811986
  • Filename
    811986