DocumentCode
3407403
Title
Error comparison for different current patterns in electrical impedance imaging
Author
Cheng, Kuo-Sheng ; Isaacson, D. ; Newell, J.C. ; Gisser, D.G.
Author_Institution
Rensselaer Polytech. Inst., Troy, NY, USA
fYear
1988
fDate
4-7 Nov. 1988
Firstpage
279
Abstract
Different current patterns used in electric-current computed tomography (ECCT) were compared for their sensitivity to noise. This comparison was made by examining the error produced in reconstructing one voltage pattern from measurements made using another. It was found that the adjacent-pair current pattern is more sensitive to noise than spatial trigonometric current patterns. The measured spatial trigonometric voltage patterns were not degraded when a simulated electrode contact impedance was introduced.<>
Keywords
bioelectric phenomena; computerised tomography; electric current; electric impedance; errors; noise; ECCT; adjacent-pair current pattern; current patterns; electric-current computed tomography; electrical impedance imaging; electrode contact impedance; error; noise; sensitivity; spatial trigonometric current patterns; spatial trigonometric voltage patterns; voltage pattern;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1988. Proceedings of the Annual International Conference of the IEEE
Conference_Location
New Orleans, LA, USA
Print_ISBN
0-7803-0785-2
Type
conf
DOI
10.1109/IEMBS.1988.94516
Filename
94516
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