• DocumentCode
    3409
  • Title

    Modeling and Analysis of Power Distribution Networks in 3-D ICs

  • Author

    Xiang Hu ; Peng Du ; Buckwalter, James F. ; Chung-kuan Cheng

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California at San Diego, La Jolla, CA, USA
  • Volume
    21
  • Issue
    2
  • fYear
    2013
  • fDate
    Feb. 2013
  • Firstpage
    354
  • Lastpage
    366
  • Abstract
    This paper addresses the modeling and analysis problems for power distribution networks (PDNs) in 3-D ICs. An on-chip distributed model is proposed for 3-D power grids, in which the details of metal layers are considered. The distributed model is demonstrated to be essential to identifying the unique noise behavior of 3-D PDNs. A lumped model is proposed based on the distributed model. The lumped model features the connection impedance between tiers and is proven to be useful for designers to understand the global effects of 3-D PDNs. Based on the models, an analysis flow is designed for 3-D PDNs in both frequency domain and time domain. With the analysis flow, the electrical characteristics of 3-D PDNs are studied systematically for the first time. The frequency-domain analysis identifies the global and local resonance phenomena in 3-D PDNs that are distinct from those in 2-D PDNs. The physical mechanisms behind the resonance phenomena are investigated. The time-domain analysis predicts the worst-case supply noise based on distributed current constraints. The “Rogue Wave” concept is introduced to explain the spatial and temporal relations of the worst-case on-chip noise responses in 3-D PDNs.
  • Keywords
    distribution networks; frequency-domain analysis; lumped parameter networks; three-dimensional integrated circuits; time-domain analysis; 3D IC; 3D power distribution networks; 3D power grids; Rogue Wave concept; connection impedance; distributed current constraints; electrical characteristics; frequency-domain analysis; global resonance phenomena; local resonance phenomena; lumped model; metal layers; on-chip distributed model; time-domain analysis; unique noise behavior; worst-case on-chip noise responses; worst-case supply noise; Analytical models; Integrated circuit modeling; Metals; Noise; Power grids; Solid modeling; System-on-a-chip; 3-D IC; modeling and analysis; power distribution network;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2012.2183904
  • Filename
    6144046