Title :
Spectral analysis of the electromechanical response of an electroactive material by implementation of Fourier decomposition
Author :
DiAntonio, C.B. ; Williams, F.A., Jr. ; Pilgrim, S.M. ; Schulze, W.A.
Author_Institution :
Lab. for Electron. Ceramics, Alfred Univ., NY, USA
fDate :
28 May-1 June 2002
Abstract :
Implementation of a discrete Fourier transform in conjunction with Devonshire phenomenology allows the electromechanical response of an electroactive material to be fully characterized. The main thrust of this examination is the incorporation of signal decomposition through Fourier analysis to quantify the electro-mechanical and aging properties. Fourier analysis is a well-used technique in the electrical engineering community; however, it has not been applied to materials. The application presented here allows a fresh look at some old phenomena. The spectral representation provides to the underlying physics of the response, i.e., odd harmonics only exist for acentric materials. The ability to create the harmonic spectrum also provides a new way to characterize the effects of aging by revealing subtle changes in the fundamental components that comprise the response. This study shows how Fourier analysis can be applied to a PMN-PT-BT composition to characterize and quantify its electromechanical properties.
Keywords :
Fourier analysis; ageing; barium compounds; discrete Fourier transforms; electromechanical effects; lead compounds; piezoelectric materials; spectral analysis; Devonshire phenomenology; Fourier decomposition; PMN-PT-BT composition; PMN-PbTiO3-BaTiO3; PbMgO3NbO3-PbTiO3-BaTiO3; acentric materials; aging properties; discrete Fourier transform; electroactive material; electromechanical response; harmonic spectrum; signal decomposition; spectral analysis; Aging; Capacitive sensors; Ceramics; Dielectric materials; Electromechanical sensors; Ferroelectric materials; Laboratories; Signal analysis; Signal resolution; Spectral analysis;
Conference_Titel :
Applications of Ferroelectrics, 2002. ISAF 2002. Proceedings of the 13th IEEE International Symposium on
Print_ISBN :
0-7803-7414-2
DOI :
10.1109/ISAF.2002.1195868