Title :
Rapid specification of hardware-in-the-loop test systems in the automotive domain based on the electric / electronic architecture description of, vehicles
Author :
Hillenbrand, Martin ; Heinz, Matthias ; Müller-Glaser, Klaus D.
Author_Institution :
Inst. for Inf. Process. Technol. (ITIV), Karlsruhe Inst. of Technol. (KIT), Karlsruhe, Germany
Abstract :
The fast growth of complexity of modern cars, motorbikes and commercial vehicles continues. Although the number of applied Electronic Control Units (ECUs) decreases, they have to fulfill more and more functions concerning performance, comfort and safety. The electric and electronic architecture (EEA) of a vehicle forms the basis for those features and functionalities. An elaborated and evaluated EEA is developed in the concept phases of the vehicle development lifecycle. For a short time, the tool PREEvision offers the possibilities to model EEAs considering different views to the architecture (requirements, software, hardware, wiring harness, topology, etc.). For test and evaluation of the vehicle´s functionalities, Hardware in the Loop (HiL) technology is utilized to cover the integration phase of hardware and software. The specification and design of HiL test systems (HiL-TS) is a complex and time-consuming procedure that can be supported by information about electric and electronic artifacts and their relationship, both available in the EEA model. This paper presents an approach for rapid specification, development and application of HiL-TSs as well as rapidly prototyping systems.
Keywords :
automotive electronics; electronic engineering computing; formal specification; vehicles; ECU; HiL technology; automotive domain; electric architecture; electronic architecture; electronic control unit; hardware-in-the-loop test system; rapid specification; vehicle development lifecycle; Computational modeling; Connectors; Data mining; Hardware; Object oriented modeling; Software; Vehicles;
Conference_Titel :
Rapid System Prototyping (RSP), 2010 21st IEEE International Symposium on
Conference_Location :
Fairfax, VA
Print_ISBN :
978-1-4244-7073-0
Electronic_ISBN :
978-1-4244-7072-3
DOI :
10.1109/RSP.2010.5656344