Title :
Simultaneous switching noise estimation for ASICs
Author :
Vemuru, Srinivasa R
Author_Institution :
Dept. of Electr. Eng., City Univ. of New York, NY, USA
Abstract :
Simultaneous switching noise (SSN) on power supply lines is caused by the switching current flowing through parasitic inductances at the chip-package-pin interface. A new formulation for SSN in CMOS circuits that includes the velocity saturation effects seen in the short-channel MOSFETs is derived. The effect of skewing output voltage switching among different drivers on SSN is studied. SSN of ASICs when used in single-chip printed wiring board and multichip module environments are discussed
Keywords :
CMOS integrated circuits; application specific integrated circuits; driver circuits; integrated circuit noise; ASICs; CMOS circuits; chip-package-pin interface; drivers; multichip module; parasitic inductances; power supply lines; short-channel MOSFETs; simultaneous switching noise; single-chip printed wiring board; velocity saturation; Application specific integrated circuits; Circuit noise; Driver circuits; Inverters; MOSFETs; Multichip modules; Negative feedback; Packaging; Power supplies; Voltage;
Conference_Titel :
ASIC Conference and Exhibit, 1995., Proceedings of the Eighth Annual IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-2707-1
DOI :
10.1109/ASIC.1995.580670
