Title :
Growth and characterization of relaxor ferroelectric (1-x)Pb(Sc12/Nb12/)O3 - xPbTiO3 single crystals
Author :
Bing, Y.-H. ; Ye, Z.-G.
Author_Institution :
Dept. of Chem., Simon Fraser Univ., Burnaby, BC, Canada
fDate :
28 May-1 June 2002
Abstract :
Growth and characterization of the single crystals of complex perovskite (1-x)Pb(Sc12/Nb12/)O3-xPbTiO3 [PSNT] with composition near the MPB (x=0.425) are reported in this paper. The PSNT crystals were grown by high temperature solution method using the (PbO + δB2O3) system as flux. By analyzing the defects and morphology of the as-grown crystals, we have optimized the growth parameters and the flux system, leading to a significant improvement in the quality of crystal grown. Domain observation by polarized light microscopy reveals that the structure of the PSNT57.5/42.5 crystal has very complex symmetry at room temperature. The PSNT crystals have been characterized by means of the X-ray, dielectric and ferroelectric measurements.
Keywords :
crystal growth from solution; crystal morphology; dielectric hysteresis; lead compounds; optical microscopy; permittivity; piezoelectric materials; relaxor ferroelectrics; Pb(ScNb)O3-PbTiO3; complex perovskite; defects; dielectric constant; dielectric dispersion; dielectric hysteresis loops; domain observation; growth parameters; high temperature solution method; morphology; morphotropic phase boundary; polarized light microscopy; relaxor ferroelectric; single crystal growth; Ceramics; Composite materials; Crystalline materials; Crystals; Dielectric materials; Ferroelectric materials; Niobium; Relaxor ferroelectrics; Solids; Temperature;
Conference_Titel :
Applications of Ferroelectrics, 2002. ISAF 2002. Proceedings of the 13th IEEE International Symposium on
Print_ISBN :
0-7803-7414-2
DOI :
10.1109/ISAF.2002.1195964
