Title :
Cosmic-ray immune latch circuit for 90nm technology and beyond
Author :
Arima, Yasunobu ; Yamashita, Takayoshi ; Komatsu, Yosuke ; Fujimoto, Takafumi ; Ishibashi, Koji
Author_Institution :
STARC, Yokohama, Japan
Abstract :
A cosmic-ray immune latch circuit is presented. The storage node is separated into three electrodes, and the soft error on one node can be corrected by the other two, even if there is a large and long-lasting influx of radiation-induced charges. The circuit is proved to have significant tolerance by utilizing a test chip.
Keywords :
error correction; flip-flops; gamma-ray effects; majority logic; neutron effects; radiation hardening (electronics); 90 nm; cosmic-ray immune latch circuit; electrode separated storage nodes; radiation tolerance; radiation-induced charge influx; soft error correction; Circuit noise; Circuit testing; Cosmic rays; DH-HEMTs; Electricity supply industry; Flip-flops; Latches; Logic circuits; Neutrons; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2004. Digest of Technical Papers. ISSCC. 2004 IEEE International
Print_ISBN :
0-7803-8267-6
DOI :
10.1109/ISSCC.2004.1332809
