Title :
New Test Method for the Pulse Immunity of Microcontrollers
Author :
Su, Tao ; Unger, Markus ; Steinecke, Thomas ; Weigel, Robert
Author_Institution :
Infineon Technol. AG, Neubiberg
Abstract :
The paper presents a new test method for pulse susceptibility of microcontrollers which reflects the electromagnetic environment of microcontrollers in practical applications. The method includes a set of electromagnetic interference pulses and their injection networks. The waveforms of the pulses are deduced from measurements on real application boards of microcontrollers.
Keywords :
electromagnetic wave interference; integrated circuit testing; microcontrollers; electromagnetic interference pulses; microcontrollers; pulse immunity test method; pulse susceptibility; pulse waveform; Circuit testing; EMP radiation effects; Electromagnetic interference; Electromagnetic measurements; Electronic equipment testing; IEC standards; Immunity testing; Integrated circuit testing; Microcontrollers; Pulse measurements;
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-1349-4
Electronic_ISBN :
1-4244-1350-8
DOI :
10.1109/ISEMC.2007.12
