DocumentCode
3415293
Title
New Test Method for the Pulse Immunity of Microcontrollers
Author
Su, Tao ; Unger, Markus ; Steinecke, Thomas ; Weigel, Robert
Author_Institution
Infineon Technol. AG, Neubiberg
fYear
2007
fDate
9-13 July 2007
Firstpage
1
Lastpage
6
Abstract
The paper presents a new test method for pulse susceptibility of microcontrollers which reflects the electromagnetic environment of microcontrollers in practical applications. The method includes a set of electromagnetic interference pulses and their injection networks. The waveforms of the pulses are deduced from measurements on real application boards of microcontrollers.
Keywords
electromagnetic wave interference; integrated circuit testing; microcontrollers; electromagnetic interference pulses; microcontrollers; pulse immunity test method; pulse susceptibility; pulse waveform; Circuit testing; EMP radiation effects; Electromagnetic interference; Electromagnetic measurements; Electronic equipment testing; IEC standards; Immunity testing; Integrated circuit testing; Microcontrollers; Pulse measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
Conference_Location
Honolulu, HI
Print_ISBN
1-4244-1349-4
Electronic_ISBN
1-4244-1350-8
Type
conf
DOI
10.1109/ISEMC.2007.12
Filename
4305592
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