Title :
Analysis of scanners for TFT-LCD
Author :
Fleischer, David L. ; Hatalis, Miltiadis K.
Author_Institution :
Display Res. Lab., Lehigh Univ., Bethlehem, PA, USA
Abstract :
Gate-line drivers can be implemented with a variety of circuit techniques. In this paper we consider these techniques and how they relate to low temperature poly-Si TFT-LCD. We analyze the tradeoffs between various circuit architectures and identify implementations that are both robust to processing noise and economical in transistor count
Keywords :
CMOS digital integrated circuits; MOS digital integrated circuits; SPICE; digital simulation; driver circuits; elemental semiconductors; liquid crystal displays; shift registers; silicon; thin film transistors; CMOS; NMOS; Si; gate line scanner; gate-line drivers; polysilicon TFT-LCD; processing noise; scanners; shift register; tradeoffs; transistor count; Circuits; Displays; Feedback; Inverters; Laboratories; Latches; MOS devices; Signal design; Switches; Thin film transistors;
Conference_Titel :
Active Matrix Liquid Crystal Displays, 1995. AMLCDs '95., Second International Workshop on
Conference_Location :
Bethlehem, PA
Print_ISBN :
0-7803-3056-0
DOI :
10.1109/AMLCD.1995.540963
