DocumentCode :
3417745
Title :
Test transformation to improve compaction by statistical encoding
Author :
Ichihara, Hideyuki ; Kinoshita, Kozo ; Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Dept. of Appl. Phys., Osaka Univ., Japan
fYear :
2000
fDate :
2000
Firstpage :
294
Lastpage :
299
Abstract :
In test compression/decompression schemes the objective is to achieve the highest compression without sacrificing fault coverage. In this paper, we propose a method to transform a test set in order to achieve higher compression without sacrificing fault coverage, while using statistical encoding techniques. The compression ratio of a test set depends on the entropy of the test set, and hence our test transformation method decreases the entropy of the test set without losing the fault coverage. Experimental results show that the proposed method transforms given test sets into highly compressible ones
Keywords :
Huffman codes; VLSI; circuit analysis computing; data compression; digital integrated circuits; encoding; entropy; integrated circuit testing; logic testing; probability; compression ratio; fault coverage; selective code; statistical encoding; test compression/decompression schemes; test set compaction; test set entropy reduction; test transformation; Compaction; Encoding; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2000. Thirteenth International Conference on
Conference_Location :
Calcutta
ISSN :
1063-9667
Print_ISBN :
0-7695-0487-6
Type :
conf
DOI :
10.1109/ICVD.2000.812624
Filename :
812624
Link To Document :
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