Thermal Influence on 16-Bits Microcontroller Emission

Author

Ben Dhia, S. ; Sicard, E. ; Mequignon, Y. ; Boyer, A. ; Dienot, J.M.

Author_Institution

INSA-Toulouse, Toulouse

fYear

2007

fDate

9-13 July 2007

Firstpage

1

Lastpage

4

Abstract

This paper deals with the thermal influence on integrated circuit performances in terms of parasitic emission. Emission measurements results conducted on a 16-bit microcontroller at extreme temperature conditions are provided, showing a difference of 10 dB between -40degC and 125degC. We detail a predictive approach for modeling the emission level variation with temperature. The simulation takes into account temperature-dependant passive and active device models. It is shown that the silicon substrate, drivers and on-chip capacitance play significant roles in the increase in emission levels when lowering the operating temperature.

Keywords

microcontrollers; active device models; emission level variation; integrated circuit performances; microcontroller emission; onchip capacitance; parasitic emission; silicon substrate; temperature-dependant passive device; thermal influence; Circuit simulation; Electric variables measurement; Electrical resistance measurement; Electromagnetic compatibility; Integrated circuit measurements; Magnetic field measurement; Microcontrollers; Predictive models; Probes; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on

Conference_Location

Honolulu, HI

Print_ISBN

1-4244-1349-4

Electronic_ISBN

1-4244-1350-8

Type

conf

DOI

10.1109/ISEMC.2007.158

Filename

4305738