• DocumentCode
    3418062
  • Title

    The Effects of ESD in Multiple Testing Environments on Adhesive-Label RFID Tags

  • Author

    Bauer-Reich, C. ; Nelson, R.M. ; Vaselaar, D.

  • Author_Institution
    North Dakota State Univ., Fargo,
  • fYear
    2007
  • fDate
    9-13 July 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The purpose of this study was to determine the ESD susceptibility of commercially available label-enclosed RFID tags. Six different types of adhesive labels with RFID transponders were subjected to ESD in different testing environments. Initial data shows that most of the tags were sufficiently protected from fairly large discharges by their covering material. The magnitude of discharge and distance of the discharge to the IC did not have the expected effects on the tags. Instead, the presence of a ground plane and low label resistance were correlated to larger damage rates. The type of antenna and IC also played a role in susceptibility.
  • Keywords
    adhesives; electrostatic discharge; radiofrequency identification; transponders; ESD susceptibility; RFID transponders; adhesive-label RFID tags; electrostatic discharge; multiple testing environment; Circuits; Copper; Electrostatic discharge; Plastics; Power supplies; Protection; RFID tags; Radiofrequency identification; Testing; Transponders;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    1-4244-1349-4
  • Electronic_ISBN
    1-4244-1350-8
  • Type

    conf

  • DOI
    10.1109/ISEMC.2007.172
  • Filename
    4305752