• DocumentCode
    3418289
  • Title

    Reduced cycle time epoxies for flip chip underfill

  • Author

    Bonneau, Mark ; Stewart, John

  • Author_Institution
    Ablestik Lab. EM&A, USA
  • fYear
    1997
  • fDate
    9-12 Mar 1997
  • Firstpage
    57
  • Lastpage
    61
  • Abstract
    The further development of the epoxy flip chip underfill encapsulant material has been demonstrated as necessary to enhance the temperature cycle performance of the solder ball connections. A reduction of the epoxy encapsulant under fill processing and cure time is needed in order to better fit into the production line environment. This paper reports and discusses the improvement of under fill flow speed and distance, the various material properties such as resin viscosity, filler effects and the overall rheology with respect to under fill flow. The reduction of oven cure time is a key requirement for faster “throughput” and reduction of “work in process”. The minimum cure times needed in order to maintain the level of reliability required as a flip chip under fill material are discussed. Physical material properties of these flip chip materials such as; glass transition temperature, coefficient of thermal expansion, tensile modulus, and adhesion are discussed in relation to reliability performance
  • Keywords
    encapsulation; flip-chip devices; inspection; integrated circuit packaging; integrated circuit reliability; production testing; thermal expansion; adhesion; cure time; cycle time; encapsulant material; fill processing; filler effects; flip chip underfill; flow speed; glass transition temperature; oven cure time; production line environment; reliability; resin viscosity; solder ball connections; temperature cycle performance; tensile modulus; thermal expansion; throughput; work in process; Flip chip; Maintenance; Material properties; Materials reliability; Ovens; Production; Resins; Rheology; Temperature; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials. Proceedings., 3rd International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-7803-3818-9
  • Type

    conf

  • DOI
    10.1109/ISAPM.1997.581256
  • Filename
    581256