Estimation of the permittivity of dielectrics from the scattering responses of TEM waveguides

This paper addresses the de-embedding of the propagation function of waveguides from the scattering responses of setups composed of TEM waguides terminated by launchers that introduce generic discontinuities. The de-embedding is aimed at estimating the permittivity of dielectric samples from the scattering responses of waveguides including the samples. The de-embedding is based on the double-delay method, that is applied to setups involving different launchers. A modified version of the method is also proposed to facilitate the measurement process.