• DocumentCode
    3418602
  • Title

    Built-in self-test in mixed-signal ICs: a DTMF macrocell

  • Author

    Huertas, Gloria ; Vazquez, Diego ; Rueda, Adoración ; Huertas, José L.

  • Author_Institution
    Inst. de Microelectron., Seville Univ., Spain
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    568
  • Lastpage
    571
  • Abstract
    This paper describes a Design-for-Test (DfT) approach to implement a DTMF embeddable macrocell. The goal is to prove the feasibility of a Built-In-Self-Test (BIST) methodology to mixed-signal ICs. Results from a silicon demonstrator are presented
  • Keywords
    VLSI; built-in self test; design for testability; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; ASIC; BIST methodology; DFT approach; DTMF macrocell; DTMF receiver; built-in self-test; design-for-test approach; mixed-signal ICs; Built-in self-test; Circuit testing; Electronic design automation and methodology; Feedback loop; Filter bank; Frequency; Macrocell networks; Multiplexing; Oscillators; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2000. Thirteenth International Conference on
  • Conference_Location
    Calcutta
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-0487-6
  • Type

    conf

  • DOI
    10.1109/ICVD.2000.812668
  • Filename
    812668
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3418602