DocumentCode :
3419533
Title :
SiGe building blocks for on-chip X-Band T/R modules
Author :
Dinc, Tolga ; Zihir, Samet ; Gurbuz, Yasar
Author_Institution :
Fac. of Eng. & Natural Sci., Sabanci Univ., Istanbul, Turkey
fYear :
2012
fDate :
16-18 Jan. 2012
Firstpage :
57
Lastpage :
60
Abstract :
This paper presents a T/R (transmit/receive) module for X-Band phased arrays using a 0.25 μm SiGe BiCMOS process technology. The T/R module consists of a T/R switch, a SPDT switch, a power amplifier (PA), and a low noise amplifier (LNA). The T/R switch and SPDT switch are implemented using CMOS transistors whereas the PA and LNA are based on SiGe HBTs. The designed T/R switch achieves minimum 3.2 dB insertion loss, maximum 34.8 dB isolation and has a P1dB of 28.2 dBm at 10 GHz. The SPDT switch has less than 2.2 dB loss at X-Band and occupies 0.17 mm2 chip area. The PA achieves a small-signal gain of 25 dB and a saturated output power of 23.2 dBm with 25% PAE in a 3 GHz bandwidth. Lastly, the LNA has a gain more than 19 dB and 1.65 dB (mean) noise figure at X-Band. More detailed analysis with extended results and utilized techniques will be presented at the conference.
Keywords :
BiCMOS analogue integrated circuits; CMOS analogue integrated circuits; Ge-Si alloys; MMIC power amplifiers; MOSFET; heterojunction bipolar transistors; low noise amplifiers; microwave bipolar transistors; microwave field effect transistors; BiCMOS process technology; CMOS transistors; HBT; LNA; PA; SPDT switch; SiGe; T-R switch; X-band phased arrays; bandwidth 3 GHz; frequency 10 GHz; loss 3.2 dB; low noise amplifier; on-chip X-band T-R modules; on-chip X-band transmit-receive modules; power amplifier; size 0.25 mum; Gain; Loss measurement; Power amplifiers; Silicon germanium; Switches; Switching circuits; Transistors; CMOS switch; Phased array; SiGe low noise amplifier (LNA); SiGe power amplifier (PA); T/R module; X-Band integrated circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2012 IEEE 12th Topical Meeting on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4577-1317-0
Type :
conf
DOI :
10.1109/SiRF.2012.6160132
Filename :
6160132
Link To Document :
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