Title :
Measurement based modeling of amplifiers in deep saturation
Author :
Van Moer, W. ; Rolain, Y.
Author_Institution :
Vrije Univ., Brussels, Belgium
Abstract :
A measurement based black-box modeling method for amplifiers in deep saturation is proposed. To model the amplitude and phase behaviour of an amplifier from the linear region to strong saturation, a rational Volterra model is used. The new model is compared with a standard polynomial Volterra model. The calibrated measurements are performed using the nonlinear network measurement system (NNMS).
Keywords :
Volterra series; calibration; circuit simulation; microwave power amplifiers; network analysers; amplitude behaviour; black-box modeling method; calibrated measurements; deep saturation; linear region; microwave power amplifiers; nonlinear network measurement system; phase behaviour; rational Volterra model; standard polynomial Volterra model; strong saturation; Frequency measurement; H infinity control; Kernel; Linear systems; Performance evaluation; Phase measurement; Polynomials; Power amplifiers; Power system modeling; Predictive models;
Conference_Titel :
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-5135-5
DOI :
10.1109/MWSYM.1999.779868
